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Camera-Based Testing of Photonic Integrated Circuits
The invention is in the area of non-contact testing of photonic integrated circuits. The state of the art in photonic circuit testing requires either cumbersome probes or requires fibers to be aligned to coupling locations at the edge of the die. It has been well known for some time that a sensitive microscope camera combination can detect even weakly...
Published: 3/29/2021   |   Inventor(s): Thomas Brown, Debra Saulnier, Tyler Howard
Keywords(s):  
Category(s): Optics