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Broadband interferometric confocal microscopy using interference objectives in combination with a synthetic phase modulation.

Background Broadband interferometric microscopy (BIM) refers to microscopy techniques and methods that use the frequency of light and interferometric detection to infer the volumetric spatial structure of the scattering object. The goal is to achieve three-dimensional imaging with high resolution over large fields of view and extended depths. The interference...

Published: 5/7/2024 | Inventor(s): P. Scott Carney, Arturo Alejandro Canales Benavides, James Zavislan

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Category(s): Imaging