Imaging Spectrometer Design Tool for Evaluating Freeform Optics

Spectral Full Field Display (SFFD) visualizes aberrations across spatial and spectral dimensions to optimize freeform optical systems

 

Institute Reference: 2-14074

Background

Modern optical systems increasingly rely on freeform surfaces to break symmetry constraints and improve imaging performance. However, designing such systems introduces complexity in evaluating aberrations like astigmatism and coma. Traditional design tools struggle to model and display these aberrations, particularly in systems with rotational asymmetry. Spectrometers, widely used in fields such as astronomy, remote sensing, and biomedical imaging, need tools that can accurately assess optical performance over both spatial and spectral dimensions.

Technology Overview

This patented technology introduces a Spectral Full Field Display (SFFD) to assist optical designers in evaluating and optimizing spectrometer performance. The system includes a ray-tracing module that models local aberrations across the image field using Zernike polynomial terms or root mean square (RMS) wavefront errors. A display module then translates these modeled aberrations into visual symbols, plotting them across two dimensions: the spatial axis, which represents the length of the spectrometer’s input slit, and the spectral axis, corresponding to the dispersion of light by wavelength. This visualization provides crucial insights by illustrating both the magnitude and orientation of aberrations, such as astigmatism and coma, allowing designers to iteratively explore and refine their designs.

Benefits

This technology offers accurate visualization by plotting both the spatial and spectral effects of aberrations, delivering deeper insights than traditional single-axis models. It facilitates the optimization of complex freeform surfaces by enabling designers to visualize multi-nodal aberration behavior. By comparing various design configurations, the system helps improve overall optical performance. Additionally, it simplifies complex ray-tracing data into intuitive visual symbols, making it user-friendly and supporting quick, informed decision-making for optical engineers.

Applications

This technology can enhance designs for astronomical spectrometers used in telescopes, improving their spectral resolution for more precise observations. It can also be used to develop advanced remote sensing devices, such as airborne or satellite hyperspectral sensors, enabling more accurate environmental monitoring. In biomedical imaging, it can help refine the design of spectral cameras used in diagnostics and microscopy to deliver greater accuracy. Additionally, the technology can drive the development of advanced imaging systems in consumer electronics, including smartphone cameras with integrated freeform optics.

Opportunity

The University of Rochester is open to exploring funded research collaborations, licensing agreements, and other partnership opportunities.

URV Reference Number: 2-14074
Patent Information:
Title Country Patent No. Issued Date
Imaging Spectrometer Design Tool for Evaluating Freeform Optics United States 9,964,444 5/8/2018
Category(s):
Optics
For Information, Contact:
Curtis Broadbent
Licensing Manager
University of Rochester
585.273.3250
curtis.broadbent@rochester.edu
Inventors:
Jannick Rolland-Thompson
Jacob Reimers
Keywords: