Balanced, Periodic Error Free, Three Degree of Freedom Interferometer

Technology Summary

 

This interferometric technology is able to measure tip/tilt and global displacement of a small target mirror (a few mm^2) using only one optical beam. Other interferometric systems require a much larger footprint on the target to measure a single axis of displacement. This means that to measure displacement, tip, and tilt, three identical systems are needed, greatly increasing the cost and making the overall footprint very large as compared to our technology.

 

See https://patents.google.com/patent/US9518816B2/en.

 

 

 

 

URV Reference Number: 2-11147-12008
Patent Information:
Category(s):
Optics
For Information, Contact:
Curtis Broadbent
Licensing Manager
University of Rochester
585.273.3250
curtis.broadbent@rochester.edu
Inventors:
Jonathan Ellis
Josephus Spronck
Keywords: