An Objective Method to Determine the Ocular Refraction from Wavefront Aberration Data and to Design an Optimum Customized Correction of a Set of a Few Higher-Order Aberrations

Brief Description
This invention provides a method to compute the correction necessary to correct for abberations in an eye of a patient, using wavefront data.

Applications
For the automated determination of an accurate, optimum refraction correction for spectacles or contact lenses, without requiring subjective input from the patient.   It enables the use of advanced wavefront diagnostic technology for routine eye exams.  The process will simplify and partially automate the work process in the retail optical environment of optometrists and dispensing ophthalmologists.

Advantages
Unlike earlier auto-refractors, this technology provides accurate determination of the refraction correction, by taking advantage of all the data available in a wavefront sensor such as a Shack Hartmann detector.   It can also be used for the prescription of advanced refraction corrections to address higher order aberrations than those typically corrected by conventional spectacles.  A complete and accurate characterization can be obtained in a fraction of a second.  

  
Patent Information:
Title Country Patent No. Issued Date
Determination of Ocular Refraction from Wavefront Aberration Data and Design of Optimum Customized Correction United States 6,511,180 1/28/2003
Category(s):
Diagnostic
For Information, Contact:
John FahnerVihtelic
Senior Licensing Manager
University of Rochester
585.276.6600
john.fahner-vihtelic@rochester.edu
Inventors:
David Williams
Antonio Guirao
Keywords: