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Method for directly measuring loss, polarization state, dispersion, and signal dynamics in photonic integrated circuits (PICs)
Background The state of the art in photonic circuit testing requires either cumbersome probes or requires fibers to be aligned to coupling locations at the edge of the die. It has been well known for some time that a sensitive microscope camera combination can detect even weakly scattered light from random defects in a photonic waveguide. However,...
Published: 12/13/2022   |   Inventor(s): Thomas Brown, Debra Saulnier, Tyler Howard
Keywords(s):  
Category(s): Optics